The realm of materials characterization is as vast and varied as the domains of materials and engineering put together. During the course of decades or centuries, several techniques went from being fairly simple to becoming quite complex. Mechanical, electrical, and thermal properties are all measured and tested, including numerous other materials, such as semiconductors, metals, insulators, ceramics, composites, and polymers; atomic, nanometer, micrometer, millimeter, and centimeter scales; picoseconds to many practice years; and simulation eons. Materials measurement may be performed in a variety of technical contexts, from pure research with murky connections to potential engineering uses to more pragmatic "real-world" field testing, which has the capacity to predict performance, and (potentially) avoid failure of components. Mastering the microstructure of materials expanded greatly in 20 th century’s second half, and this was made possible by enhancement of novel strategies for characterizing materials. Atomic penetration, X-ray diffraction, thermogravimetric analysis, electron heating and imaging are only some of the direct and indirect methods now used to analyze materials. This article discusses the scope, kinds, and applications of these methods.
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Matvey Rodya A
Tomsk State University, Tomsk, Tomsk Oblast, Russia, 634050.
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Matvey Rodya A, “A Comprehensive Review of Features, Applications and Techniques in Materials Characterization”, Journal of Computational Intelligence in Materials Science, vol.2, pp. 012-022, 2024. doi: 10.53759/832X/JCIMS202402002.
